TAN, J.; TAN, M.; CHAN, R. Quantum Metrology for High-Precision Measurement of Fundamental Constants. Journal of Tecnologia Quantica, [S. l.], v. 1, n. 4, p. 206–218, 2024. DOI: 10.70177/quantica.v1i4.1683. Disponível em: https://www.journal.ypidathu.or.id/index.php/quantica/article/view/1683. Acesso em: 5 jul. 2025.